Special Section on Quality Control by Artificial Vision

Novel image analysis method for in situ monitoring the particle size distribution of batch crystallization processes

[+] Author Affiliations
Benoît Presles

École Nationale Supérieure des Mines de Saint-Étienne, LPMG, UMR CNRS 5148, 158 cours Fauriel, 42023 Saint-Étienne Cedex 2, France

Johan Debayle

École Nationale Supérieure des Mines de Saint-Étienne, LPMG, UMR CNRS 5148, 158 cours Fauriel, 42023 Saint-Étienne Cedex 2, France

Gilles Févotte

École Nationale Supérieure des Mines de Saint-Étienne, LPMG, UMR CNRS 5148, 158 cours Fauriel, 42023 Saint-Étienne Cedex 2, France and Université Lyon 1, Campus de la Doua, 43 Boulevard du 11 Nov. 1918, 69622 Villeurbanne Cedex, France

Jean-Charles Pinoli

École Nationale Supérieure des Mines de Saint-Étienne, LPMG, UMR CNRS 5148, 158 cours Fauriel, 42023 Saint-Étienne Cedex 2, France

J. Electron. Imaging. 19(3), 031207 (August 04, 2010). doi:10.1117/1.3462800
History: Received August 03, 2009; Revised March 20, 2010; Accepted May 26, 2010; Published August 04, 2010; Online August 04, 2010
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This article presents a new in situ method to monitor the particle size distribution (PSD) during batch solution crystallization processes. Using a new in situ imaging probe, the “EZProbe sensor,” real time acquisition of 2-D images of particles during the batch process is now possible. To analyze these images, a novel image analysis method is carried out. First, segmentation and restoration algorithms are performed to identify the particles and thereafter geometrical particle measurements are achieved to obtained the PSD of the batch crystallization process over time. Satisfactory measurements are obtained provided that the overall solid concentration does not exceed a threshold above which too many overlapping crystals make discrimination between particles impossible.

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© 2010 SPIE and IS&T

Citation

Benoît Presles ; Johan Debayle ; Gilles Févotte and Jean-Charles Pinoli
"Novel image analysis method for in situ monitoring the particle size distribution of batch crystallization processes", J. Electron. Imaging. 19(3), 031207 (August 04, 2010). ; http://dx.doi.org/10.1117/1.3462800


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