Special Section on Image Quality

Measurement quality metrics for rapid laser range scanning

[+] Author Affiliations
David MacKinnon

National Research Council of Canada, Institute for Information Technology

François Blais

National Research Council of Canada, Institute for Information Technology

Victor Aitken

Carleton University, Department of Systems and Computer Engineering, Canada

J. Electron. Imaging. 19(1), 011004 (January 07, 2010). doi:10.1117/1.3267094
History: Received April 21, 2009; Revised June 18, 2009; Accepted July 22, 2009; Published January 07, 2010
Text Size: A A A

Quality metrics quantify by how much some aspect of a measurement deviates from a predefined standard. Measurement quality evaluations of laser range scanner data are used to perform range image registration, merging measurements, and view planning. We develop a scanning method that uses laser range scanner quality metrics to both reduce the time required to obtain a complete range image from a single viewpoint and the number of measurements obtained during the scanning process. This approach requires a laser range scanner capable of varying both the area and sampling density of individual scans, but can be combined with view planning methods to reduce the total time required to obtain a complete surface map of an object. Several new quality metrics are introduced: outlier, resolvability, planarity, integration, return, and enclosed quality metrics. These metrics are used as part of a quality-based merge method, referred to here as a quality-weighted modified Kalman minimum variance (weighted-MKMV) estimation method. Experimental evidence is presented confirming that this approach can significantly reduce the total scanning time. This approach could be particularly useful for rapidly generating CAD models of real-world objects.

Figures in this Article
© 2010 SPIE and IS&T

Citation

David MacKinnon ; François Blais and Victor Aitken
"Measurement quality metrics for rapid laser range scanning", J. Electron. Imaging. 19(1), 011004 (January 07, 2010). ; http://dx.doi.org/10.1117/1.3267094


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.