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Image-based evaluation of seam puckering appearance

[+] Author Affiliations
Binjie Xin

Hong Kong Polytechnic University, Institute of Textiles and Clothing, Hung Hom, ST611, Hong Kong, 852

George Baciu

Hong Kong Polytechnic University, Department of Computing, Hong Kong, 852

Jinlian Hu

Hong Kong Polytechnic University, Institute of Textiles and Clothing, Hung Hom, ST611, Hong Kong, 852

J. Electron. Imaging. 17(4), 043025 (December 17, 2008). doi:10.1117/1.3041171
History: Received April 27, 2008; Revised October 22, 2008; Accepted October 27, 2008; Published December 17, 2008
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We present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the technician-generated grades; the presented method is insensitive to the color/texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.

© 2008 SPIE and IS&T

Citation

Binjie Xin ; George Baciu and Jinlian Hu
"Image-based evaluation of seam puckering appearance", J. Electron. Imaging. 17(4), 043025 (December 17, 2008). ; http://dx.doi.org/10.1117/1.3041171


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