Image-based evaluation of seam puckering appearance

Binjie Xin; George Baciu; Jinlian Hu

doi:10.1117/1.3041171

1 October 2008 Image-based evaluation of seam puckering appearance

Binjie Xin, George Baciu, Jinlian Hu

Author Affiliations +

Journal of Electronic Imaging, Vol. 17, Issue 4, 043025 (October 2008). https://doi.org/10.1117/1.3041171

Abstract

We present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the technician-generated grades; the presented method is insensitive to the color/texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Binjie Xin, George Baciu, and Jinlian Hu "Image-based evaluation of seam puckering appearance," Journal of Electronic Imaging 17(4), 043025 (1 October 2008). https://doi.org/10.1117/1.3041171

Published: 1 October 2008

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