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Segmentation and classification of anomalies in periodic structures

[+] Author Affiliations
Yannick Caulier

Fraunhofer Institute for Integrated Circuits IIS, Am Wolfsmantel 33, D-91058 Erlangen, Germany

Klaus Spinnler

Fraunhofer Institute for Integrated Circuits IIS, Am Wolfsmantel 33, D-91058 Erlangen, Germany

Thomas Wittenberg

Fraunhofer Institute for Integrated Circuits IIS, Am Wolfsmantel 33, D-91058 Erlangen, Germany

Salah Bourennane

Fresnel Institute, École Centrale Marseille, Campus de Saint-Jérome, av. Escadrille Normandie, F-13397 Marseille Cedex 20, France

J. Electron. Imaging. 17(3), 033014 (July 18, 2008). doi:10.1117/1.2954127
History: Received May 03, 2007; Revised March 03, 2008; Accepted March 03, 2008; Published July 18, 2008
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An alternative solution for surface inspection is being presented. It is based on a concerted combination of an adapted stripe-illumination principle together with an image processing approach specialized on the analysis of the obtained stripe images. This approach is capable of detecting, segmenting, and classifying nondefective surfaces, as well as three- and two-dimensional defective surfaces from perturbations in the stripe illumination. In contrast to alternative procedures, no calibration of illumination or camera is necessary. The principle of the proposed method using a concrete industrial application for the inspection of cylindrical metallic surfaces under structured lighting is explained. Furthermore, based on several examples involving different surface types, we demonstrate the broad range of applications for the proposed algorithm.

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© 2008 SPIE and IS&T

Citation

Yannick Caulier ; Klaus Spinnler ; Thomas Wittenberg and Salah Bourennane
"Segmentation and classification of anomalies in periodic structures", J. Electron. Imaging. 17(3), 033014 (July 18, 2008). ; http://dx.doi.org/10.1117/1.2954127


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