Special Section on Quality Control by Artificial Vision

Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

[+] Author Affiliations
No Kap Park

Seoul National University, School of Computer Science and Engineering, Artificial Intelligence Laboratory, 171-742, Seoul, Korea

Suk In Yoo

Seoul National University, School of Computer Science and Engineering, Artificial Intelligence Laboratory, 171-742, Seoul, Korea

J. Electron. Imaging. 17(3), 031107 (September 23, 2008). doi:10.1117/1.2957879
History: Received July 18, 2007; Revised December 20, 2007; Accepted January 01, 2008; Published September 23, 2008
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We propose an evaluation system that assigns each line-type thin-film transistor liquid-crystal display defect a corresponding level that objectively agrees with human visual perception. By “objective,” we mean that the evaluation corresponds, on average, with the assessment of a group of inspectors. The basic idea is to use the human visual perception to evaluate defects. Crucial features of defects are selected to represent the human visual perception for the line-type defect. In the process, we define the “just-noticeable difference surface” (JND) and evaluate the level of defect as the distance from a feature point consisting of selected features of the JND.

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Citation

No Kap Park and Suk In Yoo
"Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception", J. Electron. Imaging. 17(3), 031107 (September 23, 2008). ; http://dx.doi.org/10.1117/1.2957879


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