Regular Articles

Streak detection in mottled and noisy images

[+] Author Affiliations
Hector Santos Rosario

MKS Instruments, 100 Highpower Rd., Rochester, New York, 14623

Eli Saber

Rochester Institute of Technology, Department of Electrical Engineering, Rochester, New York, 14623

Wencheng Wu

Xerox Corporation, 800 Phillips Rd., Webster, New York, 14580

Kartheek Chandu

Rochester Institute of Technology, Department of Electrical Engineering, Rochester, New York 14623

J. Electron. Imaging. 16(4), 043005 (December 06, 2007). doi:10.1117/1.2816444
History: Received October 05, 2006; Revised May 30, 2007; Accepted May 31, 2007; Published December 06, 2007
Text Size: A A A

We describe a method for automatically detecting streaks in printed images using adaptive window-based image projections and mutual information. The proposed approach accepts a scanned image enclosing the defect and computes the projections across the entire image at different window sizes. The resulting traces collected from the projections are analyzed with a peak detection algorithm and subsequently correlated using normalized mutual information to pinpoint the location and width of streak(s). Finally, for a given peak, the window size is changed adaptively to identify and locate the intensity and length of the corresponding streak(s) while maximizing the signal-to-noise ratio. Results on synthetic and real-life images are provided to demonstrate the effectiveness of our proposed technique.

© 2007 SPIE and IS&T

Citation

Hector Santos Rosario ; Eli Saber ; Wencheng Wu and Kartheek Chandu
"Streak detection in mottled and noisy images", J. Electron. Imaging. 16(4), 043005 (December 06, 2007). ; http://dx.doi.org/10.1117/1.2816444


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.