Regular Articles

Photorealistic integral photography using a ray-traced model of capturing optics

[+] Author Affiliations
Spyros S. Athineos

University of Athens, Department of Informatics and Telecommunications, Athens 15784, Greece

Nicholas P. Sgouros

University of Athens, Department of Informatics and Telecommunications, Athens 15784, Greece

Panagiotis G. Papageorgas

Technological Educational Institute of Piraeus, Electronics Department, Athens 12244, Greece

Dimitris E. Maroulis

University of Athens, Department of Informatics and Telecommunications, Athens 15784, Greece

Manolis S. Sangriotis

University of Athens, Department of Informatics and Telecommunications, Athens 15784, Greece

Nikiforos G. Theofanous

University of Athens, Department of Informatics and Telecommunications, Athens 15784, Greece

J. Electron. Imaging. 15(4), 043007 (October 13, 2006). doi:10.1117/1.2360692
History: Received July 07, 2005; Revised April 13, 2006; Accepted May 04, 2006; Published October 13, 2006
Text Size: A A A

We present a new approach for computer-generated integral photography (IP) based on ray tracing, for the reconstruction of high quality photorealistic 3-D images of increased complexity. With the proposed methodology, all the optical elements of a single-stage IP capturing setup are physically modeled for the production of real and virtual orthoscopic IP images with depth control. This approach is straightforward for translating a computer-generated 3-D scene to an IP image, and constitutes a robust methodology for developing modules that can be easily integrated in existing ray tracers. An extension of this technique enables the generation of photorealistic 3-D videos [integral videography (IV)] and provides an invaluable tool for the development of 3-D video processing algorithms.

Figures in this Article
© 2006 SPIE and IS&T

Citation

Spyros S. Athineos ; Nicholas P. Sgouros ; Panagiotis G. Papageorgas ; Dimitris E. Maroulis ; Manolis S. Sangriotis, et al.
"Photorealistic integral photography using a ray-traced model of capturing optics", J. Electron. Imaging. 15(4), 043007 (October 13, 2006). ; http://dx.doi.org/10.1117/1.2360692


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.