Regular Articles

Algorithms for sensor chip alignment to blind datums

[+] Author Affiliations
Gary B. Hughes

FLIR Systems Indigo Operations, 70 Castilian Drive, Goleta, California 93117

J. Electron. Imaging. 15(3), 033003 (July 24, 2006). doi:10.1117/1.2234326
History: Received October 07, 2005; Revised February 15, 2006; Accepted February 16, 2006; Published July 24, 2006
Text Size: A A A

The sensor element of an imaging system should be mounted into its housing in such a way that the scene can be properly focused onto the sensor element’s focal plane over the active area. Operational imaging requirements are forcing increasingly smaller tolerances on sensor alignment, and manufacturing systems must improve alignment capability to keep pace. Imaging system designs include reference datums that provide the basis for manufacturing alignment of optical components in each subassembly. Design constraints for alignment of the sensor element into the camera housing typically include x,y,z, clocking, and parallelism specifications. Measurement of z and parallelism positioning is often problematic, since the relevant reference datum features are often beneath the mounting platform and are obscured to the measurement system. General algorithms for determining sensor chip alignment when datum features are inaccessible to the measurement system are described. Precharacterization measurements of datum surfaces are used to determine datum locations during alignment measurement. The algorithms are useful for active manufacturing alignment as well as postmounting alignment measurement. The algorithms are successfully implemented for ultraprecision, active manufacturing alignment, and postalignment measurement of IR imaging systems.

Figures in this Article
© 2006 SPIE and IS&T

Topics

Algorithms ; Sensors

Citation

Gary B. Hughes
"Algorithms for sensor chip alignment to blind datums", J. Electron. Imaging. 15(3), 033003 (July 24, 2006). ; http://dx.doi.org/10.1117/1.2234326


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

PubMed Articles
Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.