Regular Articles

On improvement of the computation speed of Otsu’s image thresholding

[+] Author Affiliations
Ku Chin Lin

Kun Shan University of Technology, Department of Mechanical Engineering, 949 Dar Wan Road, Yun Kung City, Tainan County, 71003 Taiwan, Republic of China E-mail: kclin@mail.ksut.edu.tw

J. Electron. Imaging. 14(2), 023011 (May 27, 2005). doi:10.1117/1.1902997
History: Received Feb. 3, 2004; Revised Aug. 31, 2004; Accepted Sep. 29, 2004; May 27, 2005; Online May 27, 2005
Text Size: A A A

Many previous methods for image thresholding focused on developing automatic algorithms to determine thresholds. However, most of the methods suffer from time-consuming computation for multilevel thresholding. Therefore, a fast and automatic thresholding method is desired for real-time applications. This paper proposes a new and faster method for bilevel as well as multilevel image thresholding. Taking (partial) derivatives of image between-class variance with respect to gray levels develops the proposed method. For bilevel thresholding, a nonlinear equation is derived to solve for an optimal threshold. For multilevel thresholding, a set of nonlinear equations is derived to solve for a set of optimal thresholds. A parameter is introduced to determine the class number for image classification by subjective determination of the ratio of image features to be kept after classification. Statistical performance analysis of the proposed method versus the Baysian classifier is included in this paper. Thresholding computation for the proposed method and Otsu’s [N. Otsu, “A threshold selection method from gray-level histograms,” IEEE Trans. Syst. Man, Cyber. SMC-9, 62–66 (1979)] is discussed. There are also several examples to illustrate the feasibility of the proposed method and its superiority in computation speed. © 2005 SPIE and IS&T.

© 2005 SPIE and IS&T

Citation

Ku Chin Lin
"On improvement of the computation speed of Otsu’s image thresholding", J. Electron. Imaging. 14(2), 023011 (May 27, 2005). ; http://dx.doi.org/10.1117/1.1902997


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.