Special Section on Quality Control by Artificial Vision

Improving the detection of low-density weapons in x-ray luggage scans using image enhancement and novel scene-decluttering techniques

[+] Author Affiliations
Besma Abidi

University of Tennessee, Imaging, Robotics, and Intelligent Systems Laboratory, 317 Ferris Hall, Knoxville, Tennesee?37996-2100 E-mail: besma@utk.edu

Jimin Liang

Xidian University, School of Electronic Engineering, 2 Taibai Road, Xi’an, Shaanxi?710071, China

Mark Mitckes, Mongi Abidi

University of Tennessee, Imaging, Robotics, and Intelligent Systems Laboratory, 334 Ferris Hall, Knoxville, Tennesee?37996-2100

J. Electron. Imaging. 13(3), 523-538 (Jul 01, 2004). doi:10.1117/1.1760571
History: Received Jul. 14, 2003; Accepted Feb. 20, 2004; Online July 29, 2004
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Very few image processing applications have dealt with x-ray luggage scenes in the past. Concealed threats in general, and low-density items in particular, pose a major challenge to airport screeners. A simple enhancement method for data decluttering is introduced. Initially, the method is applied using manually selected thresholds to progressively generate decluttered slices. Further automation of the algorithm, using a novel metric based on the Radon transform, is conducted to determine the optimum number and values of thresholds and to generate a single optimum slice for screener interpretation. A comparison of the newly developed metric to other known metrics demonstrates the merits of the new approach. On-site quantitative and qualitative evaluations of the various decluttered images by airport screeners further establishes that the single slice from the image hashing algorithm outperforms traditional enhancement techniques with a noted increase of 58% in low-density threat detection rates. © 2004 SPIE and IS&T.

© 2004 SPIE and IS&T

Citation

Besma Abidi ; Jimin Liang ; Mark Mitckes and Mongi Abidi
"Improving the detection of low-density weapons in x-ray luggage scans using image enhancement and novel scene-decluttering techniques", J. Electron. Imaging. 13(3), 523-538 (Jul 01, 2004). ; http://dx.doi.org/10.1117/1.1760571


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