Image Thresholding and Analysis

New grayscale hit-miss operator

[+] Author Affiliations
Arthur R. Weeks

University of Central Florida, School of Electrical and Computer Science, P.O. Box 25000, Orlando, Florida 32816

Lloyd J. Sartor

Raytheon Company, 3801 University Drive, McKinney, Texas 75071

Samuel S. Richie

University of Central Florida, School of Electrical and Computer Science, P.O. Box 25000, Orlando, Florida 32816

J. Electron. Imaging. 13(1), 169-174 (Jan 01, 2004). doi:10.1117/1.1631318
History: Received Apr. 24, 2003; Accepted Aug. 29, 2003; Online March 01, 2004
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The morphological binary hit-miss operator has been used extensively to locate features within a binary image. We propose a grayscale hit-miss operator that detects signal shapes and is applicable to scalar-valued functions on one, two, or more dimensions. The hit and miss structuring elements define the lower and upper bounds of the signal: If a signal lies between the hit and miss templates, then the hit-miss operator will produce a one output; otherwise, it will respond with zero. We incorporate a fuzzy logic element to the hit-miss operator to indicate how strongly the signal matches the hit-miss templates. © 2004 SPIE and IS&T.

© 2004 SPIE and IS&T

Citation

Arthur R. Weeks ; Lloyd J. Sartor and Samuel S. Richie
"New grayscale hit-miss operator", J. Electron. Imaging. 13(1), 169-174 (Jan 01, 2004). ; http://dx.doi.org/10.1117/1.1631318


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