ANALYSIS AND ESTIMATION

Displacement co-occurrence statistics for binary digital images

[+] Author Affiliations
Zikuan Chen

The University of California–Irvine, Department of Radiological Sciences, Irvine, California?92697-5000

Mohammad A. Karim

The City College of The City University of New York, West 138th St. and Convent Avenue, New York, New York?10031 E-mail: karim@engr.ccny.cuny.edu

Majeed M. Hayat

The University of New Mexico, Department of Electrical & Computer Engineering, Albuquerque, New Mexico 87131-1356, E-mail: hayat@eece.unm.edu

J. Electron. Imaging. 11(2), 127-135 (Apr 01, 2002). doi:10.1117/1.1455012
History: Received May 24, 1999; Revised Mar. 11, 2001; Accepted Oct. 19, 2001; Online April 12, 2002
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Displacement co-occurrence is used to describe the spatial dependence relationships of binary digital images, which in turn are used for disconnectedness detection and texture analysis. A “m-points-and-M-cells” model, in particular, is used to study one-dimensional displacement co-occurrence statistics, which then is used for row-wise and column-wise two-dimensional image analysis. A compact state is used to characterize a case for aggregating pixels into a connected region, resulting in a regular straight-line distribution of the displacement co-occurrence histogram. An image pattern is described by a scattering state that usually yields an irregular histogram distribution. With reference to the compact state’s histogram, the vector norms of the scattering states’ histograms can be used to characterize the image’s disconnectedness feature. A connected line along horizontal or vertical orientations results in zero vector norms, and therefore, the nonzero vector norm indicates the presence of disconnectedness. The displacement co-occurrence histogram is invariant under translation, and shear deformation. Using a “W-points-and-M×N-lattice” model and the concept of rectangular rectification, any binary pattern can be considered as one of its scattering states. Two-dimensional displacement co-occurrence matrices yield the statistics of two-dimensional displacement configurations, and can be used in texture analysis. © 2002 SPIE and IS&T.

© 2002 SPIE and IS&T

Citation

Zikuan Chen ; Mohammad A. Karim and Majeed M. Hayat
"Displacement co-occurrence statistics for binary digital images", J. Electron. Imaging. 11(2), 127-135 (Apr 01, 2002). ; http://dx.doi.org/10.1117/1.1455012


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