SPECIAL SECTION ON BIOMEDICAL IMAGE REPRESENTATION

Automatic detection of clustered microcalcifications in digitized mammogram films

[+] Author Affiliations
Songyang Yu, Ling Guan

University of Sydney, Department of Electrical Engineering, Sydney NSW?2006, Australia

Stephen Brown

CSIRO Telecommunication and Industrial Physics, Epping, NSW?2121, Australia

J. Electron. Imaging. 8(1), 76-82 (Jan 01, 1999). doi:10.1117/1.482700
History: Received July 10, 1998; Accepted September 17, 1998
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Abstract

The existence of clustered microcalcifications is one of the important early signs of breast cancer. This paper presents an image processing procedure for the automatic detection of clustered microcalcifications in digitized mammograms. In particular, a sensitivity range of around one false positive per image is targeted. The proposed method consists of two main steps. First, possible microcalcification pixels in the mammograms are segmented out using wavelet features or both wavelet features and gray level statistical features, and labeled into potential individual microcalcification objects by their spatial connectivity. Second, individual microcalcifications are detected by using the structure features extracted from the potential microcalcification objects. The classifiers used in these two steps are feedforward neutral networks. The method is applied to a database of 40 mammograms (Nijmegen database) containing 105 clusters of microcalcifications. A free response operating characteristics curve is used to evaluate the performance. Results show that the proposed procedure gives quite satisfactory detection performance. In particular, a 93% mean true positive detection rate is achieved at the price of one false positive per image when both wavelet features and gray level statistical features are used in the first step. © 1999 SPIE and IS&T.

© 1999 SPIE and IS&T

Citation

Songyang Yu ; Ling Guan and Stephen Brown
"Automatic detection of clustered microcalcifications in digitized mammogram films", J. Electron. Imaging. 8(1), 76-82 (Jan 01, 1999). ; http://dx.doi.org/10.1117/1.482700


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